Other Composites and Related Materials


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41. Yu-Cheng Liu, Yasuhiro Aoyagi and D.D.L. Chung, ¡°Development of Epoxy-Based Electrets¡±, J. Mater. Sci. 43(5), 1650-1663 (2008).
1.J.O.G. Parent, D.D.L. Chung and I.M. Bernstein, "Effects of Intermetallic Formation at the Interface between Copper and Tin-Lead Solder", J. Mater. Sci. 23, 2564-2572 (1988).
2.Mingguang Zhu and D.D.L. Chung, "Active Brazing Alloy Paste as a Totally Metal Thick Film Conductor Material", J. Electron. Mater. 23(6), 541-549 (1994).
3.D.D.L. Chung, "Electrical Behavior of Solids", J. Educational Modules for Mat. Sci. Eng. 2, 747 (1980).
4.Mingguang Zhu and D.D.L. Chung, "On the Simultaneous Calcination and Sintering of YBa2Cu3O7-x in High -Magnetic Fields", Mater. Lett. 18, 186-190 (1994).
5.Shoukai Wang and D.D.L. Chung, "Self-Monitoring of Strain in Silicon Carbide Whisker Reinforced Silicon Nitride", Smart Mater. Struct. 6, 199-203 (1997).
6.Xiangcheng Luo and D.D.L. Chung, "A Comparative Study of Silver-Epoxy and Tin-Lead Solder in Their Joints with Copper, through Mechanical and Electrical Measurements During Debonding", J. Mater. Sci. 34, 273-276 (1999).
7.Jian Wang and D.D.L. Chung, "A Comparative Study of the Vibration Damping Capacity of Superalloys", J. Mater. Eng. Perf. 8, 577-578 (1999).
8.Xiangcheng Luo and D.D.L. Chung, "Interface in Mechanically Fastened Steel Joint, Studied by Contact Electrical Resistance Measurement", J. Mater. Eng. Perf. 9(1), 95-97 (2000).
9.Yunsheng Xu, Xiangcheng Luo and D.D.L. Chung, "Sodium Silicate Based Thermal Pastes for High Thermal Contact Conductance", J. Electron. Packaging 122(2), 128-131 (2000).
10.D.D.L. Chung, "Materials for Electromagnetic Interference Shielding", J. Mater. Eng. Perf. 9(3), 350-354 (2000).
11.Xiangcheng Luo and D.D.L. Chung, "Material Contacts under Cyclic Compression, Studied in Real Time by Electrical Reistance Measurement", J. Mater. Sci. 35(19), 4795-4802 (2000).
12.Xiangcheng Luo and D.D.L. Chung, "Degradation of Mechanically Fastened Stainless Steel Joint During Repeated Fastening and Unfastening", Adv. Eng. Mater. 3(1-2), 62-65 (2001).
13.Zongrong Liu and D.D.L. Chung, "Development of Glass-Free Metal Electrically Conductive Thick Films", J. Electron. Packaging 123(1), 64-69 (2001).
14.D.D.L. Chung, "Thermal Interface Materials", J. Mater. Eng. Perf. 10(1), 56-59 (2001).
15.D.D.L. Chung, "Materials for Thermal Conduction", Appl. Thermal Eng. 21(ER16), 1593-1605 (2001).
16.D.D.L. Chung, "Joints Obtained by Soldering, Adhesion, Autohesion and Fastening, Studied by Electrical Resistance Measurement", J. Mater. Sci. 36(11), 2591-2596 (2001).
17.Xiangcheng Luo, Yunsheng Xu and D.D.L. Chung, "Thermal Stability of Thermal Interface Pastes Evaluated by Thermal Contact Conductance Measurement", J. Electron. Packaging 123(3), 309-311 (2001).
18.Taejin Kim and D.D.L. Chung, "Effect of Stress on the Electrical Resistivity of Solder", J. Electron. Mater. 30(10), L29-L31 (2001).
19.Wenhai Fu and D.D.L. Chung, "Vibration Reduction Ability of Polymers, Particularly Polymethylmethacrylate and Polytetrafluoroethylene", Polym. Polym. Compos. 9(6), 423-426 (2001).
20.Zongrong Liu and D.D.L. Chung, "Low Temperature Air-Fireable Glass-Free Metallic Thick Film Electrical Conductor Materials", J. Electron. Mater. 11(30), 1458-1465 (2001).
21.Xiangcheng Luo and D.D.L. Chung, "Effect of the Thickness of a Thermal Interface Material (Solder) on Heat Transfer Between Copper Surfaces", Int. J. Microcircuits Electronic Packaging 24(2), 141-147 (2001).
22.D.D.L. Chung, "Materials for Vibration Damping", J. Mater. Sci. 36(24), 5733-5737 (2001).
23.J.A. Fernando and D.D.L. Chung, "Pore Structure and Permeability of an Alumina Fiber Filter Membrane for Hot Gas Filtration", J. Porous Mater., 9(3),211-219(2002).
24.J.A. Fernando and D.D.L. Chung, "Improving an Alumina Fiber Filter Membrane for Hot Gas Filtration using an Acid Phosphate Binder", J. Mater. Sci. 36(21), 5079-5085 (2001).
25.D.D.L. Chung, "Intrinsically Smart Structural Composites", Materials Today Jan. 2002, p. 30-35.
26.Xiangcheng Luo and D.D.L. Chung, "Irreversible Structural Change at the Interface Between Components During Fastening", Fastener Tech. Int. 25(1), 86-87 (2002).
27.Taejin Kim and D.D.L. Chung,"Thermoelectric Behavior of Solder", J. Electron. Packaging 125(1), 161-162 (2003).
28.Kyu-Dong Kim and D.D.L. Chung, "Effect of Heating on the Electrical Resistivity of Conductive Adhesive and Soldered Joints", J. Electron. Mater. 31(9), 933-939 (2002).
29.Matthew Poeller and D.D.L. Chung, "Effect of Heating on the Structure of an Adhesive Joint, as Indicated by Electrical Resistance Measurement", J. Adhesion 79(6), 549-558 (2003).
30.Sihai Wen and D.D.L. Chung, "Effect of Stress on the Dielectric Constant of Alumina", J. Electron. Packaging, 127(3), 235-236 (2005)
31.Shoukai Wang and D.D.L. Chung, "Piezoresistivity in Silicon Carbide Fibers", J. Electroceramics 10, 147-152 (2003).
32.Zongrong Liu and D.D.L. Chung, "Comparative Study of Electrically Conductive Thick Films With and Without Glass", J. Electron. Mater. 33(3), 194-202 (2004).
33.J.A. Fernando and D.D.L. Chung, "Thermomechanical Properties of Alumina Fiber Membrane", Ceramics Int.31(3), 453-460 (2005).
34.Zongrong Liu and D.D.L. Chung, "Burnout of the Organic Vehicle in an Electrically Conductive Thick-Film Paste", J. Electron. Mater. 33(11), 1316-1325 (2004).
35.Zongrong Liu and D.D.L. Chung, "Effect of Firing Atmosphere on Air-Fireable Glass-Free Electrically Conductive Thick Film", J. Electron. Mater. 34(3), 287-293 (2005).
36.Kyu Dong Kim and D.D.L. Chung, "Electrically-Conductive Adhesive and Soldered Joints under Compression", J. Adh. Sci. Tech. 19(11), 1003-1023 (2005).
37.Junhua Wu and D.D.L. Chung, "Pastes for Electromagnetic Interference Shielding", J. Electron. Mater.34(9), 1255-1258 (2005).
38.Taejin Kim and D.D.L. Chung, "Mats and Fabrics for Electromagnetic Interference Shielding", J. Mater. Eng. Perf., 15, 295-298 (2006)
39.D.D.L. Chung, "Advances in Thermal Interface Materials", Advancing Microelectronics, 33(4), 8-11 (2006).
40.Yu-Cheng Liu, Yasuhiro Aoyagi and D.D.L. Chung, "Development of Epoxy-Based Electrets", J. Mater. Sci., 43(5), 1650-1663 (2008).